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Displaying 1-7 of 7 results for author "Tobin, Kenneth W."
Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California / Kenneth W. Tobin, Ning S. Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [1999], ©1999.
- 1999-1999
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .M32 1999g Off-site Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California / Kenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [2000], ©2000.
- 2000-2000
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .M32 2000g Off-site Metrology-based control for micro-manufacturing : 24-25 January 2001, San Jose, USA / Kenneth W. Tobin, Fred Lakhani, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [2001], ©2001.
- 2001-2001
- 1 Item
Item details Format Call Number Item Location Text TA418.7 .M48 2001g Off-site Design, process integration, and characterization for microelectronics : 6-7 March 2002, Santa Clara, USA / Alexander Starikov, Kenneth W. Tobin, Jr., chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [2002], ©2002.
- 2002-2002
- 1 Item
Item details Format Call Number Item Location Text TK7874 .D47565 2002g Off-site Process and materials characterization and diagnostics in IC manufacturing : 27-28 February 2003, Santa Clara, California, USA / Kenneth W. Tobin, Jr., Iraj Emami, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.
- Text
- Bellingham, Wash., USA : SPIE, [2003], ©2003.
- 2003-2003
- 1 Item
Item details Format Call Number Item Location Text TK7874 .P745 2003g Off-site Sixth International Conference on Quality Control by Artificial Vision : 19-22 May 2003, Gatlinberg, Tennessee, USA / Kenneth W. Tobin, Jr., Fabrice Meriaudeau, chairs/editors ; sponsored by UT-Battelle [and others] in cooperation with IEEE Signal Processing Society, SPIE--the International Society for Optical Engineering, [and] Machine Vision Association of SME--Society of Manufacturing Engineers (USA).
- Text
- Bellingham, Wash., USA : SPIE, [2003], ©2003.
- 2003-2003
- 1 Item
Item details Format Call Number Item Location Text TS156.2 .I566 2003g Off-site Data analysis and modeling for process control : 26-27 February 2004, Santa Clara, California, USA / Kenneth W. Tobin, Jr., chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International [and] International SEMATECH.
- Text
- 2004
- 1 Item
Item details Format Call Number Item Location Text TS183 .D37 2004g Off-site
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