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Displaying 1-3 of 3 results for author "Marshall, J. C. (Janet C.)"
MEMS length and strain round robin results with uncertainty analysis / Janet C. Marshall; Robert I. Scace; Winthrop A. Baylies.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2006.
- 2006
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo98009Evaluating a chip, wafer, or lot using SUXES, SPICE, and STAT2 / J. C. Marshall, R. L. Mattis.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
- 1992
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo100528Design and testing guides for the CMOS and lateral bipolar-on-SOI test library / Janet C. Marshall, Mona E. Zaghloul.
- Text
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1994.
- 1994
- 1 Resource
Available Online
https://purl.fdlp.gov/GPO/gpo94768
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