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Forensic evidence analysis and crime scene investigation : 20-21 November, 1996, Boston, Massachusetts / John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by, National Institute of Standards and Technology [and others] ; cooperating organizations, National Institute of Justice [and others].
Text
Bellingham, Wash., USA : SPIE, [1997], ©1997.
1997-1997
1 item
Format | Call number | Item location |
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FormatText | Call numberHV7936.E7 F67 1996g | Item locationOff-site |
Forensic evidence analysis and crime scene investigation : 20-21 November, 1996, Boston, Massachusetts / John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by, National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.].
Text
Bellingham, Wash., USA : SPIE, c1997.
1997
1 item
Format | Call number | Item location |
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FormatText | Call numberTA1505 .P762 vol.2941 | Item locationOff-site |