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Forensic evidence analysis and crime scene investigation : 20-21 November, 1996, Boston, Massachusetts / John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by, National Institute of Standards and Technology [and others] ; cooperating organizations, National Institute of Justice [and others].

Text

Bellingham, Wash., USA : SPIE, [1997], ©1997.

1997-1997

1 item

FormatCall numberItem location
FormatTextCall numberHV7936.E7 F67 1996gItem locationOff-site
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