Research Catalog

Forensic evidence analysis and crime scene investigation : 20-21 November, 1996, Boston, Massachusetts

Title
  1. Forensic evidence analysis and crime scene investigation : 20-21 November, 1996, Boston, Massachusetts / John Hicks, Peter R. De Forest, Vivian M. Baylor, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cosponsored by, National Institute of Standards and Technology ... [et al.] ; cooperating organizations, National Institute of Justice ... [et al.].
Published by
  1. Bellingham, Wash., USA : SPIE, c1997.

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Details

Additional authors
  1. Hicks, John.
  2. De Forest, Peter R.
  3. Baylor, Vivian M.
  4. National Institute of Standards and Technology (U.S.)
  5. National Institute of Justice (U.S.)
  6. Society of Photo-Optical Instrumentation Engineers.
Description
  1. v, 148 p. : ill.; 28 cm.
Series statement
  1. Proceedings / SPIE--the International Society for Optical Engineering ; v. 2941
Uniform title
  1. Proceedings of SPIE--the International Society for Optical Engineering ; v. 2941.
Subject
  1. Forensic sciences > Congresses
  2. Electronics in criminal investigation > Congresses
Bibliography (note)
  1. Includes bibliographic references and author index.