Research Catalog

Micro-optical technologies for measurement, sensors, and microsystems : 12-13 June 1996, Besançon, France

Title
Micro-optical technologies for measurement, sensors, and microsystems : 12-13 June 1996, Besançon, France / Olivier M. Parriaux, chair/editor ; sponsored by CNRS--Centre National de la Recherche Scientifique [and others].
Publication
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, [1996], ©1996.

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Details

Additional Authors
  • Parriaux, Olivier M.
  • Centre national de la recherche scientifique (France)
  • Society of Photo-optical Instrumentation Engineers.
Description
vii, 334 pages : illustrations; 28 cm.
Series Statement
  • Proceedings EurOpt series
  • SPIE proceedings series ; 2783
Uniform Title
  • Proceedings of SPIE--the International Society for Optical Engineering ; v. 2783.
  • Europto series.
Subjects
Bibliography (note)
  • Includes bibliographical references and author index.
Contents
  • Digital Light Processing and MEMS: reflecting the digital display needs of the networked society / L. J. Hornbeck -- Microlasers: key components for optical microsystems / S. Valette -- Impact of diffractive optics on the design of optical pick up / J.-C. Lehureau -- Active and passive optical components using liquid crystals / M. Stalder -- Stabilized microchip lasers fabricated by micro-optical technologies / M. Rabarot, V. Tarazona, E. Molva and C. Clement -- Micro-optical devices based on free-space optics with LIGA micro-optical benches: examples and perspectives / J. Mohr, J. Gottert and A. Muller -- Micro-optics for sensor applications / Ph. Nussbaum, R. Volkel, H. P. Herzig and R. Dandliker -- Carbon super tips on AFM probes as near-field PSTM sensors / M. Castagne, M. Benfedda, S. Lahimer, J. Fillard and L. Grimont -- One-level gray-tone lithography: mask data preparation and pattern transfer / K. Reimer, H. Quenzer, R. Demmeler and B. Wagner --
  • Glass wafer direct bonding: a new technology for monomode optical integrated devices / S. Pelissier, G. Pandraud, F. Pigeon, A. Mure-Ravaud, J.-P. Meunier and B. Biasse -- Assembly and interconnection technologies for electrical and optical microsystems / R. Muller-Fiedler, J. Dutzi, E. Moss, K. Kuttner, N. Kummer and M. Gundlach -- Absolute measurement of the fiber-to-waveguide distance during a coupling process by low-coherence interferometry / H. Porte, W. Elflein and R. Ferriere -- Mounting, cementing, and handling of micro-optical elements / V. Guyenot, R. Eberhardt, G. Tittelbach and S. Risse -- Integrated motion system for self-alignment of micro-optical devices / D. Collard, Y. Fukuta, T. Akiyama, D. Chauvel and H. Fujita -- Beam steering without moving parts / V. Hinkov -- Challenges of a Digital Micromirror Device: modeling and design / R. L. Knipe --
  • E-beam tandem writes short-pitch DOEs and gratings for EU-922 FOTA and other optical microsystems / E.-B. Kley and O. M. Parriaux -- Micro-optical beam deflectors and modulators: present state of development / R. Goring and S. Glockner -- Micro-optomechanical devices: an electrostatically actuated bending waveguide for optical coupling / F. Chollet, M. M. de Labachelerie and H. Fujita -- Microactuator for microwave antennas / D. Chauvel, D. Collard and H. Fujita -- High-resolution position encoder insensitive to misalignment / K. Engelhardt and P. Seitz -- High-resolution heterodyne interferometric rotation encoder with frequency-modulated laser diode / P. Drabarek, M. van Keulen, G. Kuhnle and S. Steinlechner -- Feedback interferometry with semiconductor laser for high-resolution displacement sensing / S. Donati, S. Merlo and F. Micolano -- New high-resolution displacement sensor based on surface plasmon resonance / G. Margheri, A. Mannoni and F. Quercioli --
  • High-resolution absolute position detection using a multiple grating / U. Schilling, P. Drabarek, G. Kuhnle and H. J. Tiziani -- New integrated optics displacement sensor in glass / T. Lang, D. Genon-Catalot, P. Dandrea, I. Schanen Duport and P. Benech -- Smart image sensors: an emerging key technology for advanced optical measurement and microsystems / P. Seitz -- Photonic microsystems based on artificial retinas / X. Arreguit and P. Debergh -- Integrated optical interferometers for refractometry and chemical sensing / A. Brandenburg -- Microspectrometer for the infrared range / P. Krippner, J. Mohr, C. Muller and C. van der Sel -- High-resolution real-time adaptive optic microsensor for residual stress and vibration measurement in situ / G. E. Dovgalenko and I. I. Loutchkina -- Optimizing the optics for evanescent wave analysis with laser diodes (EWALD) for monitoring chlorinated hydrocarbons in water / J. F. Kastner, M. Tacke, S. Silverstein and A. Katzir --
  • Length-division-sensitive birefringent fiber FMCW remote strain sensor / G. Zheng, M. Campbell and P. A. Wallace -- FMCW birefringent fiber strain sensor with two forward-coupled beams / M. Campbell, G. Zheng and P. A. Wallace -- Range imaging sensor with no moving parts / J. A. Marszalec, R. A. Myllyla, I. Moring and J. Lammasniemi -- Replication of micro-optical profiles in ORMOCER and other polymers / I. Anke, E.-B. Kley, H. Hubner, B. Schnabel and R. Pohlmann.
ISBN
0819421693
LCCN
96067691
OCLC
ocm35619599
Owning Institutions
Columbia University Libraries